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列表文章資訊參考來源
At-speed Testing Made Easy - EE ...
EE Times examines techniques for making at-speed testing easier, including an overview of path delay model and transition delay model. ...（以下省略）
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2023年6月8日 — At-speed testing is a critical technique employed to ensure reliability of advanced electronic systems. Ge...
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由 W Qiu 著作 · 被引用 7 次 — Therefore at-speed test is preferred to increase the realistic delay fault coverage. However,...
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At-speed tests when added with the traditional stuck-at tests, guarantees maximum fault coverage and reduced. DPM rates ...
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EE Times examines techniques for making at-speed testing easier, including an overview of path delay model and transitio...
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由 V Vorisek 著作 · 被引用 20 次 — This paper discusses the aspects and associated requirements of design and implementatio...
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2020年12月28日 — 1.at speed test structure and OCC Controller. 2.OCC Controller. 当使用set_dft_configuration -clock_controll...
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A second common type of fault model is called the “transition” or “at-speed ... The value of Iddq testing is that many t...
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At-speed scan testing is becoming more and more popular in the semiconductor industry, as the relevance of delay-induced...
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2018年2月15日 — At-speed testing, also known as at-speed scan testing, is a technique used in the field of DFT to verify ...
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2017年1月11日 — 俯身。凑近我。用力吻住我……我被他吻得就快喘不上气。可仍闭紧牙关。一声不吭。方宴不满，就死命咬我。电话那头。谢川焦急地喊我名字，「于欢？」「于欢？
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at speed testing 參考影音
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