Scan at speed 相關文章
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PDF | The authors describe new strategies where at-speed scan tests can be applied with internal PLL. They present techn...
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2016年10月8日 — at-speed 就是实速测试, 主要用于scan测试-即AC测试,和mbist测试。这种测试手段的目的是-测试芯片在其工作频率下是否能正常工作,实速即实际速度。
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A second common type of fault model is called the “transition” or “at-speed” fault model, and is a dynamic fault model, ...
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In this technique, the entire scan data shifting can be done at slow speeds in test mode, and then two at-speed clocks a...
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2020年12月28日 — 1.at speed test structure and OCC Controller. 2.OCC Controller. 当使用set_dft_configuration -clock_controll...
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由 V Vorisek 著作 · 被引用 20 次 — An innovative method of scan pattern timing creation based on the results from Static Ti...
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2018年2月15日 — Generally the scan part can be understood as a way to discover stuck at faults, at speed faults. Stuck at...
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At-speed scan testing is becoming more and more popular in the semiconductor industry, as the relevance of delay-induced...
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The Speed Scan and Index in IBM Datacap Navigator provides high-speed scanning and indexing scenarios for better perform...
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Both work by generating scan patterns that can be scanned in at a slow speed. After a scan vector is scanned in, two or ...
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